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http://www.ingentaconnect.com/content/asp/jnn/2010/00000010/00000005/art00030
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* R- P: [/ s9 h/ M0 x: l/ LSize Effect of Nano Scale Phase Change Random Access Memory ; X- Q8 ?' Y" q4 R: @
Authors: Son, Ji Hoon; Choi, HongKyw; Jang, Nakwon; Kim, Hong Seung; Yi, Dong Young; Lee, Seong Hwan
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Source: Journal of Nanoscience and Nanotechnology, Volume 10, Number 5, May 2010 , pp. 3165-3169(5)6 h- f1 X- J- u: r8 \

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